MIEDL, P.; AHMED, R.; THIELE, L. We know what you’re doing! Application detection using thermal data. Leibniz Transactions on Embedded Systems, Wadern, Germany, v. 7, n. 1, p. 02:1–02:28, 2021. DOI: 10.4230/LITES.7.1.2. Disponível em: https://ojs.dagstuhl.de/index.php/lites/article/view/lites-v007-i001-a002. Acesso em: 23 sep. 2021.